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High Speed High Voltage Testing.
The speed of high voltage testing is often a subject of interest and debate. The fact is that most specifications demand a specific Ramp time and Measure Dwell time, and dictate the grouping that can be used (1 to ALL , or Signal to Ground etc). The MK system enables the user to define the optimum allowable Ramp, Pre Dwell, and Measure Dwell times with the test programme, and offers total flexibility in terms of grouping (1 to 1, 1 to ALL, Group to Group).
In addition MK has developed a High Speed algorithm named the “n-1” HV test. This algorithm is derived from the high volume pcb testing world, and automatically creates groups of nets that are then tested against each other, ensuring that during the test sequence each net is at some point tested against every other net. This option greatly reduces testing time and is in use with a number of our customer who are reporting dramatic and immediate benefit. Please contact MK for further detail.
Your Benefit: Flexible options ensuring the optimum in HV testing speed..
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