| Continuity |
| Current |
5mA to 1000mA Programmable 1mA |
Voltage |
1V to 30V Programmable to 1V |
High Voltage
DC |
Voltage |
25V to 500V Programmable 5V |
Current |
0.1uA to 4000uA |
| High Voltage
AC (when fitted) |
| Voltage |
25V to 250V RMS @ 50 Hz Programmable to 5V |
| Current |
1uA to 5000uA |
Typical Test Performance |
| Continuity |
Switching speed > 50000 points per second
0.05s per established connection
0.05s shorts test per point |
| Insulation and Hi-pot |
Programmable Ramp, Pre Dwell and Dwell times.
Minimum 0.1s per point |
Measurements |
| Continuity |
0.1
to 100K
Accuracy 0.5% +/- 0.1
@ 1000mA
Resolution 0.1 |
| DC Insulation |
5K
to 200M
Accuracy 5% |
| AC Hi-pot |
1uA to 5000uA Accuracy 5% |
Interface |
128 off 2 wire Test points per board
Maximum 2048 test points per sub-rack, maximum 512 sub-racks,
524288 points
Connection via high specification 64 way ‘DIN 41612’
type sockets
Connection on pins a1 to a32, c1 to c32, interlock on front
panel
|
Options |
Extended continuity range up to 1M
Increased continuity test current up to 10A
Custom voltages up to 100KV
External Instruments and customised electrical tests
Communication with other devices
Customised import facility for programme creation
Capacitance and Inductance Measurement |